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A high spatial resolution non-contact temperature measurement and mapping technique
Seeking commercialization partner forTemperature Mapping by Electron Probe in Scanning Electron MicroscopeRensselaer researchers have developed a scanning electron microscopy based temperature mapping technique which employs a temperature sensitive electron signal for nano-scale resolution, non-contact measurement. It provides enhanced capabilities...
Published: 10/8/2024
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Inventor(s): Xiaowei Wu, Robert Hull
Keywords(s): Environment
Category(s): Technology Classifications > Energy, Technology Classifications > Engineering & Physical Science, Technology Classifications > Environment
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